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Nanoscope
Scanning Probe Microscopes
 |
- Multimode 8:
- Max. 125 x 125 um2
scanning
area and 5120 x 5120 pixels resolution
- STM (Scanning Tunneling Microscopy),
contact
and tapping AFM (Atomic Force Microscopy), current and force
spectroscopy, lithography mode
- Phase, lateral force and peak force AFM
imaging
- Electric Force, Magnetic Force,
Conductive etc.
AFM
- Quantitative mechanical measurements
- Current Imaging Tunneling Spectroscopy
(IIIA
controller)
- Bruker
(2011)
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WiTec Alpha 300 RSA+ combined
Raman, AFM and SNOM microscope
 |
- Confocal Raman imaging, 488, 532
&
633 nm
- Contact and tapping AFM
- Scanning Near Field Optical Microscopy
(SNOM)
- Fully integrated control and imaging
- WiTec
(2012)
|
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Bruker AXS D8 Discover
X-Ray Diffractometer
|
- - 2 Dim. detector
- - XYZ stage
- - Eulerian cradle
- - for phase identification, texture
analysis
and high resolution methods
- - 2004, Bruker
AXS
|
|
Avantes dual
channel microspectrometer
 |
- UV-VIS-NIR spectrometer, 200-1100 nm
- Minimum spot size: < 200 um
-
Avantes
(2003)
|
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Avantes
High-sensitivity Fiber-optic spectrometer
 |
- UV-VIS-NIR spectrometer, 200-1100 nm
- TE-cooled backthinned CCD detector
- Minimum spot size: < 200 um
- 16-bit AD converter, and USB2.0 interface
- With 200 - 2500 nm Balanced light source
-
Avantes
(2013)
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Zeiss
Axioimager
A1
mat
POL optical microscope
 |
- Polarized light microscopy
- Objectives: Epiplan 2.5, 10, 20, 50 X
- Ocular: 10 X
- Bright field, polarization, C-DIC mode
- With FireWire digital camera and PC
- Reflectance, transmittance
- Zeiss
(2008)
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