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Authors : Biró,László,P.;Gyulai,József;Márk,Géza,I.;Daróczi,Csaba,S.
Title : Defects caused by high-energy ion beams, as measured by scanning probe methods
JournalName : Micron
PubDateYear : 1999
PubDateOther :
Volume : 30
Issue :
StartPage : 245
EndPage : 254
Keywords : ion-beam damage;atomic force microscopy;scanning tunneling microscopy;TOP_Ion;W_Experiment;W_STM;W_Nanotube
Notes :
Abstract : Scanning probe methods reveal new effects in the study of solids irradiated with "swift" heavy ions, i.e. with ions of extremely high energy ( > 20 MeV / nucleon ). A synergism of electronic and nuclear stopping mechanisms has been found; on irradiated highly oriented pyrolytic graphite, the formation of carbon nanotubes was observed. In the present paper, an example of modeling of scanning tunneling microscopy and some of the problems in understanding SPT images is also presented.
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