STM "TIP CHANGES" -
A POSSIBLE TOOL FOR TIP CHARACTERIZATION

L. P. Bíró, G. I. Márk, E. Balázs

Nanostructures Laboratory
MTA KFKI - Research Institute for Technical Physics and Materials Science,
H-1525 Budapest, P.O.Box 49, HUNGARY

E-mail: mark@sunserv.kfki.hu


NATO Advanced Study Institute, Nanophase Materials: Synthesis - Processes - Applications, June 20 - July 2, 1993, Corfu, Greece, poster.

NATO ASI Series: Nanophase Materials 205-208 (eds: G. C. Hadjipanayis & R. W. Siegel), 1994 Kluwer Academic Publishers
http://www.mfa.kfki.hu/int/nano/preprint/corfu1993.pdf

Abstract

A method based on the detailed analysis of tip changes is proposed for the investigation of tip cluster structure. As proposed by Mizes et al [7] the tunneling current for a multiple tip is considered to be produced by the superposition of currents corresponding to the individual tip atoms. Good agreement is found between experimental results for PtIr tips and computer simulations for a Pt15 [110] tip cluster. From the modification of the acquired image during imaging HOPG the modifications of the tip structure may be inferred.

PACS numbers: 73.40, 61.16, 68.35

Keywords

STM, image formation, tip
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Last updated: Oct 3, 2002 by Géza I. Márk , mark@sunserv.kfki.hu
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