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Nanoscope E AFM/STM
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RHK System 1000 STM
- - 0.6 x 0.6 um2 scanning area
- - STM (Scanning Tunneling Microscopy)
- - STS (Scanning Tunneling Spectroscopy)
- - September 1990, RHK Instruments
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Bruker AXS D8 Discover
X-Ray Diffractometer
- - 2 Dim. detector
- - XYZ stage
- - Eulerian cradle
- - for phase identification, texture analysis
and high resolution methods
- - 2004, Bruker
AXS
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LEO 1540 XB FESEM / FIB Nanomachining
and Observation System
- - 1.1 nm FESEM resolution
- - 7.0 nm FIB resolution
- - CrossBeam configuration
- - GEMINI column
- - 2004, LEO
Electron Microscopy
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AMRAY 600 SEM
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Underwater
AC electric arc
- - two identical carbon rods of 6 mm in diameter
- - AC power supply
- - electrodes distance regulated by computer
& stepper motors
- - December 2002, home-made
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