Nanostructures Departement

MTA EK MFA Budapest

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Nanoscope Scanning Probe Microscopes
  • Multimode 8:
  • Max. 125 x 125 um2 scanning area and 5120 x 5120 pixels resolution
  • STM (Scanning Tunneling Microscopy), contact and tapping AFM (Atomic Force Microscopy), current and force spectroscopy, lithography mode
  • Phase, lateral force and peak force AFM imaging
  • Electric Force, Magnetic Force, Conductive etc. AFM
  • Quantitative mechanical measurements
  • Current Imaging Tunneling Spectroscopy (IIIA controller)
  • Bruker (2011)
WiTec Alpha 300 RSA+ combined Raman, AFM and SNOM microscope
  • Confocal Raman imaging, 488, 532 & 633 nm
  • Contact and tapping AFM
  • Scanning Near Field Optical Microscopy (SNOM)
  • Fully integrated control and imaging
  • WiTec (2012)
Bruker AXS D8 Discover X-Ray Diffractometer
X-ray diffreactometer
  • - 2 Dim. detector
  • - XYZ stage
  • - Eulerian cradle
  • - for phase identification, texture analysis and high resolution methods
  • - 2004, Bruker AXS
Avantes dual channel microspectrometer
Avantes spectrometer
  • UV-VIS-NIR spectrometer, 200-1100 nm
  • Minimum spot size: < 200 um
  • Avantes (2003)
Avantes High-sensitivity Fiber-optic spectrometer
Avantes spectrometer
  • UV-VIS-NIR spectrometer, 200-1100 nm
  • TE-cooled backthinned CCD detector
  • Minimum spot size: < 200 um
  • 16-bit AD converter, and USB2.0 interface
  • With 200 - 2500 nm Balanced light source
  • Avantes (2013)
Zeiss Axioimager A1 mat POL optical microscope
Zeiss Axioimager A1 mat POL optical microscope
  • Polarized light microscopy
  • Objectives: Epiplan 2.5, 10, 20, 50 X
  • Ocular: 10 X
  • Bright field, polarization, C-DIC mode
  • With FireWire digital camera and PC
  • Reflectance, transmittance
  • Zeiss (2008)

Last updated: January 21, 2015 by Géza I. Márk , mark@sunserv.kfki.hu
This page was accessed  times since November 12, 2013.