List of records in nano database
IDs:
65
Authors : |
Biró,L.,P.;Gyulai,J.;Havancsák,K. |
Title : |
IN-DEPTH CHARACTERIZATION OF DAMAGE PRODUCED BY SWIFT HEAVY ION IRRADIATION USING A TAPPING MODE ATOMIC FORCE MICROSCOPE |
JournalName : |
Materials Sci. Forum |
PubDateYear : |
1997 |
PubDateOther : |
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Volume : |
248-249 |
Issue : |
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StartPage : |
129 |
EndPage : |
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Keywords : |
in-depth damage characterization;swift heavy ions;AFM;tapping mode;STM;parallel irradiation;Si;HOPG;mica |
Notes : |
This paper compares TM-AFM and STM measurements on Si, HOPG, and mica samples irradiated under parallel incidence. A mecanism is proposed by which the TM-AFM can measure the differences between the vacancy reach and self-interstitial rich regions. |
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