List of records in nano database
IDs:
45
| Authors : |
Biró,László,P.;Gyulai,József;Márk,Géza,I.;Daróczi,Csaba,S. |
| Title : |
Defects caused by high-energy ion beams,
as measured by scanning probe methods |
| JournalName : |
Micron |
| PubDateYear : |
1999 |
| PubDateOther : |
|
| Volume : |
30 |
| Issue : |
|
| StartPage : |
245 |
| EndPage : |
254 |
| Keywords : |
ion-beam damage;atomic force microscopy;scanning tunneling microscopy;TOP_Ion;W_Experiment;W_STM;W_Nanotube |
| Notes : |
|
| Abstract : |
Scanning probe methods reveal new effects
in the study of solids irradiated with
"swift" heavy ions, i.e. with ions of
extremely high energy ( > 20 MeV / nucleon ).
A synergism of electronic and nuclear stopping
mechanisms has been found; on irradiated
highly oriented pyrolytic graphite, the
formation of carbon nanotubes was observed.
In the present paper, an example of modeling
of scanning tunneling microscopy and some of
the problems in understanding SPT images
is also presented. |
| HTML_Local : |
http://www.nanotechnology.hu/new/980904/index.html |
| HTML_Remote : |
http://www.elsevier.com/locate/micron |
| Preprint_Local : |
http://www.nanotechnology.hu/reprint/Micron_v30_p245.pdf |
| Preprint_Remote : |
|
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