List of records in nano database
IDs:
401
Authors : |
Nemes-Incze,P.;Osváth,Z.;Kamarás,K.;Biró,L.,P. |
Title : |
Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy |
JournalName : |
Carbon |
PubDateYear : |
2008 |
PubDateOther : |
|
Volume : |
46 |
Issue : |
|
StartPage : |
1435 |
EndPage : |
1442 |
Keywords : |
TOP_NanoStructDet;TOP_Graphene;W_Experiment;TOP_Methodology;W_AFM |
Notes : |
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Abstract : |
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly
used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon
oxide surfaces. It is a convenient tool to quickly determine the thickness of individual
FLG films. However, reports from literature show a large variation of the measured thickness
of graphene layers. This paper is focused on the imaging mechanism of tapping mode
AFM (TAFM) when measuring graphene and FLG thickness, and we show that at certain
measurement parameters significant deviations can be introduced in the measured thickness
of FLG flakes. An increase of as much as 1 nm can be observed in the measured height
of FLG crystallites, when using an improperly chosen range of free amplitude values of the
tapping cantilever.We present comparative Raman spectroscopy and TAFM measurements
on selected single and multilayer graphene films, based on which we suggest ways to correctly
measure graphene and FLG thickness using TAFM. |
HTML_Local : |
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HTML_Remote : |
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Preprint_Local : |
http://www.nanotechnology.hu/reprint/Carbon_46_1435_Nemes_GraphAFM.pdf |
Preprint_Remote : |
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