IDs:

356

Authors : Petrik,P;Vázsonyi,É;Fried,M;Volk,J;Andrews,G,T;Tóth,A,L;Daróczi,Cs,S;Bársony,I;Gyulai,J
Title : Optical models for the ellipsometric characterisation of porous silicon structures
JournalName : Phys Stat Sol (C)
PubDateYear : 2005
PubDateOther :
Volume : 2
Issue :
StartPage : 3319
EndPage : 3323
Keywords : TOP_NanoStructDet ;W_Experiment ;W_FESEM;W_PorSi
Notes :
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