IDs:

229

Authors : Riesz,F;Tóth,A,L;Ryc,L;Slysz,W;Wegrzecki,M
Title : EBIC study of the boundary effects in Si PIN photodiodesfor X-ray detector applications
JournalName : Nukleonika
PubDateYear : 1999
PubDateOther :
Volume : 44
Issue :
StartPage : 635
EndPage : 646
Keywords :
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