IDs:

199

Authors : Petrik,P.;Khanh,N.,Q.;Horváth,Z.,E.;Zolnai,Z.;Barsony,I.;Lohner,T.;Fried,M.;Gyulai,J.;Schmidt,C.;Schneider,C.;Ryssel,H.
Title : Non-destructive characterization of strontium bismuth tantalate films
JournalName : Materials Science in Semiconductor Processing
PubDateYear : 2002
PubDateOther :
Volume : 5
Issue :
StartPage : 141
EndPage : 145
Keywords : TOP_Misc;W_Experiment
Notes :
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