IDs:

151

Authors : Petrik,P.;Khanh,N.,Q.;Horváth,Z.,E.;Zolnai,Z.;Bársony,I.;Lohner,T.;Fried,M.;Gyulai,J.;Schmidt,C.;Schneider,C.;Ryssel,H.
Title : Characterisation of BaxSr1-xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction
JournalName : J NON-CRYST SOLIDS
PubDateYear : 2002
PubDateOther :
Volume : 303
Issue : 1
StartPage : 179
EndPage : 184
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